Machine Software

Our machine software is scalable based on the exact customer demand and machine purpose. The specific demand can range from reporting the activities of a manually operated microscope with a SECS/GEM protocol up to semi- or full-automatic quality inspection on wafer map level.

Our machine solutions

control software
 
inspection capabilities
 

Immediate Contact

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PVA TePla AG
Im Westpark 10 - 12
D-35435 Wettenberg

Phone: +49 (0) 641/68690-0
Fax: +49 (0) 641/68690-800

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