VCP-basic refers to the control software developed for quality inspection machines with a manual microscope and a wafer handler.
Feature list excerpt:
SECS/GEM compatibility
Slot selection (manual / sample / automatic by remote interface)
Manual wafer inspection with joystick
Measurement tool compatibility
Inspection process logging
VCP-control
Microscope inspection with wafermapping
VCP-control refers to the control software developed for wafermapping-based quality inspection machines. Typically this solution comes with a microscope, a motorized xy stage with vacuum chuck a wafer handler.
Feature list excerpt:
SECS/GEM compatibility
Recipe management (Operator / Engineer / Service)
Slot selection (manual / sample / automatic by remote interface)
Wafermap loading with pass/fail information (first/last map)
Manual / automatic wafer alignment
Temporary map save
Map upload to network (Yes / No / Operator decision)
Move-to-chip command by map click (chip center / relative position)
Chip position stepping algorithms for semi-automatic inspection sequences
Image analysis supported AOI script assignment in .setup
Lot summary generation
VCP-inspect
SAM/EBIS control software with wafermapping
VCP-inspect refers to the control software developed for wafermapping-based automatic quality inspection applications. Typically this solutions connects with external hardware and analysis its acquired image data.
Feature list excerpt:
Wafermap loading with pass/fail information (first/last map)
Map upload to network (Yes / No)
Image analysis supported AOI script assignment in .setup
Lot summary generation
VCP-ink
VCP-ink refers to the control software developed for the SPA-Inker machine solution. It also is compatible to the derivates PIA-ink and Frame-Inker hardware.
Feature list excerpt:
Inking and re-inking of dies according to wafer map bincodes
Out of die center inking
Inker cartridge limit control (dot amount, time duration)
Inker cartridge type control via product setup and automatic detection
