MSO optimizes multi-site probe card xy positions on wafer probers and allows the calculation of different stepping path sequences.
Key benefits:
Calculation of minimum touchdown amount for testing an entire wafer
Situation-dependent stepping path algorithms (shortest distance, x-meander, y-meander, hot probing, site balancing)
Reduction of needle re-alignments by usage of hot probing stepping path algorithms
One MSO standalone user license can generate optimized stepping data for your entire probe floor
Layout Optimizer
The MSO can be upgraded with an Automatic Layout Finder (ALF) solution, which calculates the optimal probe card channel arrangement for a given wafer type.
Key benefits:
Automatic calculation of the layout shape (channel arrangement) resulting the smallest amount of touchdowns required for testing a wafer product by consideration of the maximum amount of channels available for parallel testing
Overview of all calculated layout shapes and their MSO result data in a table allowing interactive touchdown preview
Consideration of constraints for limiting ALF results (max. probe card xy dimension, amount of skips in x or y between active probing channels)
