Features at a glance: High Throughput Up to 160 wafers per hour with automated handling for maximum productivity. Flexible Integration: Ideal for R&D or seamless integration into…
No Backside Reflection (SiC) Accurate thin-film analysis on SiC wafers, eliminating errors from backside reflections for reliable results. AlGaN Concentration Resolution via Band Edge…
LuXpector THEA No Backside Reflection (SiC) Accurate thin-film analysis on SiC wafers, eliminating errors from backside reflections for reliable results. AlGaN Concentration Resolution via…
High-precision Ellipsometry Analysis LuXpector THEA (Tool for High-precision Ellipsometry Analysis) combines ellipsometry and reflectometry in a compact, cost-effective and fast system for accurate…
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Your satisfaction is our top priority. Therefore we are pleased about your feedback:Customized solutions The key to success within a customer-focused company is the proactive elicitation of…
News News Those who are developing tomorrow’s technologies always have something new to report. You can keep up to date with all our latest news and publications here.Dates & Fairs Display all…
