VCP-inkFeature list excerpt: Inking and re-inking of dies according to wafer map bincodes Out of die center inking Inker cartridge limit control (dot amount, time duration) Inker cartridge…
Microscope inspection with wafermapping VCP-control refers to the control software developed for wafermapping-based quality inspection machines. Typically this solution comes with a microscope, a…
MIDOSFunctions implied: Database connection (Oracle) Different user groups with different authorities Visualization of defect catalogue (for schooling) Configuration of defect catalogue by…
The functions of the Defect Reviewer include: Loading of structured and unstructured KLA result file data Display of defect image data Defect selection in map display Modification of implied…
The functions of the Measurement Tool include: Linear distance measurement Area measurement (rectangles, circles, polygon) Free text comments Default text comments (e.g. usable for user…
The functions of the Wafer Map Editor include: Display and edit of chip attributes Untested, Tested, Ink edge, Skip Display and edit of bincodes Display and edit of reference die coordinate(s)…
Philosophy The customer is our dedication. We work together with our customer, so WE move as THEY do. The employees are our force. A friendly working environment and good human interrelationship…
